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Dip probe TFX20








Standard Dip Probe for laboratory and process


Request for information



Due to its slim design and because of its high energy throughput, the transflectance probe GS-TFX-20 becomes an ideal dip probe for applications under process conditions. Furtermore, the probe can be used in laboratories, pilot plant stations or technical schools. The probe will be immersed directly in the fluids and assures a true in-line analysis. Due to the insertion of sapphire optics, the GS-TFX-20 can be used in aggressive medias and allows a easy cleaning of the probe. The probe is available for the UV/VIS range as well as for the NIR region. Optical fibers can be changed without dismounting of the probe body.





SpecificationsTFX20
Measurement principleTransflection for UV / Vis or NIR
Material optic Sapphire
Material probe bodyStainless steel 316L
Diameter1/4" (6,35 mm) or 6 mm
Length130 mm + opt. path/2
Sealing materialKalrez 6375
Process connectionsSwagelok-Fitting 1/4" or 6 mm
Maximum pressure100 bar
Min / Max temperature-20░C to 250░C
Optical path lengthbetween 1 mm to 100 mm
Fiber connection600/660 um, quartz/quartz fiber, SMA
ConformityPressure directive 97/23/EU




Other materials like stainless steel 316L, Hastelloy or Peek etc. can be delivered on demand. Other sealing materials like different Kalrez are also available. For special UV-applications or on demand the probe can be delivered with quartz optics. Different length and fiber connections on demand. The probe is also available with standard ASME or DIN EN flanges.


Last change 01/10/2008
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